US6281690B1 - Coaxial radio frequency test probe - Google Patents
Coaxial radio frequency test probe Download PDFInfo
- Publication number
- US6281690B1 US6281690B1 US08/684,021 US68402196A US6281690B1 US 6281690 B1 US6281690 B1 US 6281690B1 US 68402196 A US68402196 A US 68402196A US 6281690 B1 US6281690 B1 US 6281690B1
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- US
- United States
- Prior art keywords
- contact pin
- circuit
- test probe
- grounding
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
Definitions
- the present invention relates to an improved coaxial RF probe for testing or trouble-shooting microstrip circuits while avoiding the need for adding conventional coupled test ports or resistive network test ports, which test ports degrade the performance of microstrip circuits, require space and increase the cost and weight of the circuit board.
- Manufacture and maintenance of a microstrip circuit require that functionality of various stages of the circuit be measurable.
- RF circuitry it is conventional to incorporate coupled test ports on resistive network test ports at predetermined critical locations along the microstrip circuit in order to test, measure or trouble-shoot the performance of the circuit at these specific locations.
- test ports have several disadvantages including being localized, expensive, requiring space and adding weight to the circuit board. More importantly, such test ports degrade the operation or performance of the circuit even when no tests are being performed.
- a DC-blocking device is associated with the central contact in order to provide a contact which protects the sensitive measurement device, such as a spectrum analyzer, power meter or other similar instrument against direct current damage.
- the present invention provides a novel, fixed-contact coaxial RF probe which avoids the problems of prior coaxial RF probes by fixing the distance between the circuit contact and the ground plane contact in order to provide reliable and repeatable measurements.
- the need for test ports, which degrade the performance of the microstrip circuit, is avoided.
- variation in the electrical losses normally encountered with the use of conventional coaxial RF probes having a flexible ground wire, depending upon the arbitrary distance between the ground contact and the microstrip contact are eliminated so that the losses are predictable and balance each other with repeated measurements.
- test probes are easier to use than the prior-known test probes having a flexible wire ground lead which must be clipped or otherwise grounded to a ground plane, in a first operation, prior to the steps of pressing the central test contact against the area of the microstrip circuit being evaluated.
- FIG. 1 is a diagrammatic view of a coaxial radio frequency test probe according to a preferred embodiment of the present invention, illustrating the probe in position between a microstrip/ground plane of a printed circuit board and a power measuring device such as a spectrum analyzer, and
- FIG. 2 is a magnified view of the probe of FIG. 1 taken along the line 2 — 2 thereof.
- the coaxial RF test probe 10 thereof is similar in most respects to a conventional coaxial RF test probe except that a conductive receptacle plate 11 supporting a grounding contact pin 12 is soldered in fixed spacing relative to the coaxial circuit contact section 13 of the probe, in electrical connection with the outer conductive jacket 14 of the semi-rigid coaxial cable 15 of the probe and insulated against electrical communication with the central test contact pin 16 of the coaxial cable 15 .
- the plate 11 and grounding contact pin 12 replace the flexible grounding wire and clip used on prior known coaxial RF test probes on which the grounding wire is soldered or otherwise fixed in electrical connection with the outer conductive jacket of the coaxial cable, and a terminal clip is soldered to the end of the grounding wire for grounding attachment to variable locations of the ground plane of the microstrip circuit board.
- the test probe 10 of FIGS. 1 and 2 comprises the semi-rigid coaxial cable section 15 connected by means of an upper jack connector 17 to a conventional coaxial DC block fitting 18 having inside/outside capacitance in series with both the outer conductive jacket 14 and the inner central conductive contact 16 of the cable 15 .
- Cable 20 is connected to the probe 10 by means of an outlet jack connector 21 .
- the DC block fitting preferably is a MDC 1182-A-S18 device commercially-available from MIDISCO, Commack, N.Y. It operates over a frequency range of 0.1 to 18 GHz.
- the lower end of the semi-rigid coaxial cable section 15 is connected to the circuit contact section 13 of the probe 10 by means of a lower inlet jack connector 22 .
- the conductive receptacle plate 11 is provided with spaced bores 23 and 24 . Bore 23 is slightly larger in diameter than the diameter of the coaxial circuit contact section 13 , and the receptacle plate 11 is soldered to the underside of the inlet jack connector 22 and to the outer conductive jacket 14 of the coaxial cable, insulated against electrical connection with the central test contact pin 16 of the coaxial cable.
- Plate 11 preferably is a passivated stainless steel and may be plated, such as with gold, to improve soldering properties.
- the smaller bore 24 of the receptacle plate 11 has a diameter slightly larger than the diameter of the conductive tubular receptical or housing 25 containing an internal spring 26 for spring-loading the pin 12 in adjustable extension from the housing 25 .
- the conductive housing 25 preferably is soldered to the plate 11 , within the bore 24 , for grounding the contact pin 12 in electrical connection with the plate 11 and with the outer conductive jacket 14 of the coaxial cable 15 , insulated from the central conductor or pin 16 of the cable 15 .
- the grounding pin can be soldered to the plate 11 , within the bore 24 , or may be vertically adjustably engaged therewithin, such as threadably-engaged, for vertical adjustment relative to the length of the contact section 13 and the ground plane height.
- the preferred embodiment involves spring-loading the contact pin 12 within the housing 25 , which makes the pin self-adjusting and assures good contact with the grounding plane 27 .
- the essential novelty of the present test probes is that the circuit contact pin 16 and the grounding contact pin 12 are fixed to the probe in closely spaced relation to each other, whereby electrical losses encountered during use of the probe are minimized and rendered uniform and predictable. Therefore the probe can be calibrated against a standard to allow for the uniform electrical losses.
- the close spacing between the circuit contact pin 16 and the grounding pin 12 requires that the ground plane 27 and the microstrip circuit 28 to be evaluated must be closely spaced on the surface of the printed circuit board (PCB) 29 .
- PCB printed circuit board
- a preferred spacing between the tips or centers of the pins 12 and 16 is between about 0.2 and 0.3 inch, most preferably about 0.24 inch, which requires that the ground plane and the microstrip are spaced no more than about 0.22 inch.
- Such probes have been found to encounter power losses between about 10 and 12 dB.
- the fixed spacing between the grounding pin 12 and the circuit pin 16 can be greater than 0.3 inch, up to about 0.5 inch, but that the greater spacing produces reduced reliability during testing.
- the receptical plate 11 can be slightly longer in the horizontal direction to increase the spacing between the bores 23 and 24 , or two or more horizontally-spaced alternative bores 24 may be provided in the plate 11 to adapt the probe for alternative use in testing microstrip circuits in which the ground plane is spaced from the microstrip by more than about 0.3 inch, up to about 0.5 inch.
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/684,021 US6281690B1 (en) | 1996-07-19 | 1996-07-19 | Coaxial radio frequency test probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/684,021 US6281690B1 (en) | 1996-07-19 | 1996-07-19 | Coaxial radio frequency test probe |
Publications (1)
Publication Number | Publication Date |
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US6281690B1 true US6281690B1 (en) | 2001-08-28 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US08/684,021 Expired - Fee Related US6281690B1 (en) | 1996-07-19 | 1996-07-19 | Coaxial radio frequency test probe |
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US (1) | US6281690B1 (en) |
Cited By (44)
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---|---|---|---|---|
US6452379B1 (en) * | 2000-10-20 | 2002-09-17 | Teradyne, Inc. | Methods and apparatus for connecting to a signal launch |
US20030179533A1 (en) * | 2002-03-21 | 2003-09-25 | Polyphaser Corporation | Isolated shield coaxial surge suppressor |
US6639154B1 (en) * | 2000-10-10 | 2003-10-28 | Teradyne, Inc. | Apparatus for forming a connection between a circuit board and a connector, having a signal launch |
US20040051536A1 (en) * | 2001-12-10 | 2004-03-18 | Doug Kreager | Coaxial radio frequency adapter and method |
US6731104B1 (en) * | 2002-12-05 | 2004-05-04 | Tektronix, Inc. | Measurement probe system with EOS/ESD protection |
US6734689B1 (en) | 2002-12-05 | 2004-05-11 | Tektronix, Inc. | Measurement probe providing signal control for an EOS/ESD protection module |
US20040263189A1 (en) * | 2003-06-30 | 2004-12-30 | Perry Richard S. | Probe of under side of component through opening in a printed circuit board |
US6905466B2 (en) | 2002-10-10 | 2005-06-14 | Koninklijke Philips Electronics, N.V. | Imaging ultrasound transducer temperature control system and method using feedback |
US20050212541A1 (en) * | 2004-03-25 | 2005-09-29 | Charles Ruff | Test probe |
US6956448B1 (en) | 2002-12-17 | 2005-10-18 | Itt Manufacturing Enterprises, Inc. | Electromagnetic energy probe with integral impedance matching |
US20060176065A1 (en) * | 2005-02-04 | 2006-08-10 | Alexander Koch | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
DE102006021569A1 (en) * | 2006-02-09 | 2007-08-16 | Rohde & Schwarz Gmbh & Co. Kg | Test system for a circuit carrier |
US20080116924A1 (en) * | 2006-11-20 | 2008-05-22 | Gerard Blaney | Device under test pogo pin type contact element |
US20090103226A1 (en) * | 2007-10-18 | 2009-04-23 | Polyphaser Corporation | Surge suppression device having one or more rings |
US20090109584A1 (en) * | 2007-10-30 | 2009-04-30 | Polyphaser Corporation | Surge protection circuit for passing dc and rf signals |
US20090284888A1 (en) * | 2008-05-19 | 2009-11-19 | Polyphaser Corporation | Dc and rf pass broadband surge suppressor |
US20110018524A1 (en) * | 2009-07-24 | 2011-01-27 | Fitzsimmons Gary F | System and Method for Nondestructive Detection of Electrical Sensors and Cables |
US20110080683A1 (en) * | 2009-10-02 | 2011-04-07 | Jones Jonathan L | Rf coaxial surge protectors with non-linear protection devices |
US20110102007A1 (en) * | 2008-08-01 | 2011-05-05 | Ghadaksaz Michael M | Calibrated wideband high frequency passive impedance probe |
US20110159727A1 (en) * | 2009-12-28 | 2011-06-30 | Matt Howard | Power distribution device |
US20110235229A1 (en) * | 2010-03-26 | 2011-09-29 | Nguyen Eric H | Ethernet surge protector |
US8432693B2 (en) | 2010-05-04 | 2013-04-30 | Transtector Systems, Inc. | High power band pass RF filter having a gas tube for surge suppression |
US8441795B2 (en) | 2010-05-04 | 2013-05-14 | Transtector Systems, Inc. | High power band pass RF filter having a gas tube for surge suppression |
US8611062B2 (en) | 2010-05-13 | 2013-12-17 | Transtector Systems, Inc. | Surge current sensor and surge protection system including the same |
US8730637B2 (en) | 2010-12-17 | 2014-05-20 | Transtector Systems, Inc. | Surge protection devices that fail as an open circuit |
US8730640B2 (en) | 2010-05-11 | 2014-05-20 | Transtector Systems, Inc. | DC pass RF protector having a surge suppression module |
US8976500B2 (en) | 2010-05-26 | 2015-03-10 | Transtector Systems, Inc. | DC block RF coaxial devices |
US9048662B2 (en) | 2012-03-19 | 2015-06-02 | Transtector Systems, Inc. | DC power surge protector |
US9054514B2 (en) | 2012-02-10 | 2015-06-09 | Transtector Systems, Inc. | Reduced let through voltage transient protection or suppression circuit |
US20150198643A1 (en) * | 2014-01-16 | 2015-07-16 | International Business Machines Corporation | Implementing handheld transfer impedance probe |
US9124093B2 (en) | 2012-09-21 | 2015-09-01 | Transtector Systems, Inc. | Rail surge voltage protector with fail disconnect |
US9190837B2 (en) | 2012-05-03 | 2015-11-17 | Transtector Systems, Inc. | Rigid flex electromagnetic pulse protection device |
US9924609B2 (en) | 2015-07-24 | 2018-03-20 | Transtector Systems, Inc. | Modular protection cabinet with flexible backplane |
US9991697B1 (en) | 2016-12-06 | 2018-06-05 | Transtector Systems, Inc. | Fail open or fail short surge protector |
US10129993B2 (en) | 2015-06-09 | 2018-11-13 | Transtector Systems, Inc. | Sealed enclosure for protecting electronics |
US20180335553A1 (en) * | 2016-12-29 | 2018-11-22 | HKC Corporation Limited | Method for manufacturing color filter substrate and method for manufacturing liquid crystal panel |
US10193335B2 (en) | 2015-10-27 | 2019-01-29 | Transtector Systems, Inc. | Radio frequency surge protector with matched piston-cylinder cavity shape |
US10356928B2 (en) | 2015-07-24 | 2019-07-16 | Transtector Systems, Inc. | Modular protection cabinet with flexible backplane |
US20190356080A1 (en) * | 2017-02-08 | 2019-11-21 | Toyota Jidosha Kabushiki Kaisha | Connector structure |
US10588236B2 (en) | 2015-07-24 | 2020-03-10 | Transtector Systems, Inc. | Modular protection cabinet with flexible backplane |
US10805817B2 (en) | 2017-11-22 | 2020-10-13 | Comcast Cable Communications, Llc | Near-field communication over service networks |
CN112230026A (en) * | 2020-11-09 | 2021-01-15 | 中国电子科技集团公司第二十九研究所 | Microwave probe for detecting local performance of microsystem |
CN113917301A (en) * | 2021-10-09 | 2022-01-11 | 中国电子科技集团公司第二十九研究所 | Automatic test method of radio frequency product |
CN115598390A (en) * | 2022-11-29 | 2023-01-13 | 深圳市道格特科技有限公司(Cn) | Multi-branch coaxial broadband radio frequency probe |
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1996
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Patent Citations (6)
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US4116523A (en) * | 1976-01-23 | 1978-09-26 | James M. Foster | High frequency probe |
US4593243A (en) * | 1984-08-29 | 1986-06-03 | Magnavox Government And Industrial Electronics Company | Coplanar and stripline probe card apparatus |
US4829242A (en) * | 1987-12-07 | 1989-05-09 | Microelectronics And Computer Technology Corporation | Multigigahertz probe |
US4871964A (en) * | 1988-04-12 | 1989-10-03 | G. G. B. Industries, Inc. | Integrated circuit probing apparatus |
US5041782A (en) * | 1989-09-20 | 1991-08-20 | Design Technique International, Inc. | Microstrip probe |
US5594358A (en) * | 1993-09-02 | 1997-01-14 | Matsushita Electric Industrial Co., Ltd. | Radio frequency probe and probe card including a signal needle and grounding needle coupled to a microstrip transmission line |
Cited By (75)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6639154B1 (en) * | 2000-10-10 | 2003-10-28 | Teradyne, Inc. | Apparatus for forming a connection between a circuit board and a connector, having a signal launch |
US6717398B2 (en) | 2000-10-20 | 2004-04-06 | Teradyne, Inc. | Signal launch connecting techniques |
US6452379B1 (en) * | 2000-10-20 | 2002-09-17 | Teradyne, Inc. | Methods and apparatus for connecting to a signal launch |
US6844738B2 (en) | 2001-12-10 | 2005-01-18 | Intel Corporation | Coaxial radio frequency adapter and method |
US20040051536A1 (en) * | 2001-12-10 | 2004-03-18 | Doug Kreager | Coaxial radio frequency adapter and method |
US20040239334A1 (en) * | 2001-12-10 | 2004-12-02 | Doug Kreager | Coaxial radio frequency adapter and method |
US6863564B2 (en) | 2001-12-10 | 2005-03-08 | Intel Corporation | Coaxial radio frequency adapter and method |
US7112970B2 (en) | 2001-12-10 | 2006-09-26 | Intel Corporation | Coaxial radio frequency adapter and method |
US20030179533A1 (en) * | 2002-03-21 | 2003-09-25 | Polyphaser Corporation | Isolated shield coaxial surge suppressor |
US6975496B2 (en) * | 2002-03-21 | 2005-12-13 | Polyphaser Corporation | Isolated shield coaxial surge suppressor |
US6905466B2 (en) | 2002-10-10 | 2005-06-14 | Koninklijke Philips Electronics, N.V. | Imaging ultrasound transducer temperature control system and method using feedback |
US6731104B1 (en) * | 2002-12-05 | 2004-05-04 | Tektronix, Inc. | Measurement probe system with EOS/ESD protection |
US6734689B1 (en) | 2002-12-05 | 2004-05-11 | Tektronix, Inc. | Measurement probe providing signal control for an EOS/ESD protection module |
US7057473B1 (en) | 2002-12-17 | 2006-06-06 | Itt Manufacturing Enterprises Inc. | Electromagnetic broadside energy probe with integral impedance matching |
US6956448B1 (en) | 2002-12-17 | 2005-10-18 | Itt Manufacturing Enterprises, Inc. | Electromagnetic energy probe with integral impedance matching |
US7656151B2 (en) | 2003-06-30 | 2010-02-02 | Intel Corporation | Printed circuit board with an opening to access components attached to the printed circuit board |
US7276921B2 (en) * | 2003-06-30 | 2007-10-02 | Intel Corporation | Probe of under side of component through opening in a printed circuit board |
US20040263189A1 (en) * | 2003-06-30 | 2004-12-30 | Perry Richard S. | Probe of under side of component through opening in a printed circuit board |
US20080007286A1 (en) * | 2003-06-30 | 2008-01-10 | Intel Corporation | Probe of under side of component through opening in a printed circuit board |
US20050212541A1 (en) * | 2004-03-25 | 2005-09-29 | Charles Ruff | Test probe |
US7053643B2 (en) | 2004-03-25 | 2006-05-30 | Intel Corporation | Radio frequency (RF) test probe |
US20090134899A1 (en) * | 2005-02-04 | 2009-05-28 | Alexander Koch | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
US20080012590A1 (en) * | 2005-02-04 | 2008-01-17 | Alexander Koch | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
US7501841B2 (en) | 2005-02-04 | 2009-03-10 | Research In Motion Limited | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
US7268567B2 (en) * | 2005-02-04 | 2007-09-11 | Research In Motion Limited | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
US20060176065A1 (en) * | 2005-02-04 | 2006-08-10 | Alexander Koch | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
US7675304B2 (en) | 2005-02-04 | 2010-03-09 | Research In Motion Limited | Probe assembly with multi-directional freedom of motion and mounting assembly therefor |
DE102006021569A1 (en) * | 2006-02-09 | 2007-08-16 | Rohde & Schwarz Gmbh & Co. Kg | Test system for a circuit carrier |
US9075085B2 (en) | 2006-02-09 | 2015-07-07 | Rohde & Schwarz Gmbh & Co. Kg | Test system for analyzing a circuit carrier |
US20100233964A1 (en) * | 2006-02-09 | 2010-09-16 | Rohde & Schwarz Gmbh & Co. Kg | Test system for a circuit carrier |
US7728613B2 (en) * | 2006-11-20 | 2010-06-01 | Analog Devices, Inc. | Device under test pogo pin type contact element |
US20080116924A1 (en) * | 2006-11-20 | 2008-05-22 | Gerard Blaney | Device under test pogo pin type contact element |
US20090103226A1 (en) * | 2007-10-18 | 2009-04-23 | Polyphaser Corporation | Surge suppression device having one or more rings |
US8027136B2 (en) | 2007-10-18 | 2011-09-27 | Transtector Systems, Inc. | Surge suppression device having one or more rings |
US8553386B2 (en) | 2007-10-18 | 2013-10-08 | Transtector Systems, Inc. | Surge suppression device having one or more rings |
US20090109584A1 (en) * | 2007-10-30 | 2009-04-30 | Polyphaser Corporation | Surge protection circuit for passing dc and rf signals |
US7944670B2 (en) | 2007-10-30 | 2011-05-17 | Transtector Systems, Inc. | Surge protection circuit for passing DC and RF signals |
US20110141646A1 (en) * | 2007-10-30 | 2011-06-16 | Jones Jonathan L | Surge protection circuit for passing dc and rf signals |
US8179656B2 (en) | 2007-10-30 | 2012-05-15 | Transtector Systems, Inc. | Surge protection circuit for passing DC and RF signals |
US20090284888A1 (en) * | 2008-05-19 | 2009-11-19 | Polyphaser Corporation | Dc and rf pass broadband surge suppressor |
US8599528B2 (en) | 2008-05-19 | 2013-12-03 | Transtector Systems, Inc. | DC and RF pass broadband surge suppressor |
US20110102007A1 (en) * | 2008-08-01 | 2011-05-05 | Ghadaksaz Michael M | Calibrated wideband high frequency passive impedance probe |
US7982480B2 (en) * | 2008-08-01 | 2011-07-19 | Aes Technologies, Inc. | Calibrated wideband high frequency passive impedance probe |
US20110018524A1 (en) * | 2009-07-24 | 2011-01-27 | Fitzsimmons Gary F | System and Method for Nondestructive Detection of Electrical Sensors and Cables |
US8456791B2 (en) | 2009-10-02 | 2013-06-04 | Transtector Systems, Inc. | RF coaxial surge protectors with non-linear protection devices |
US20110080683A1 (en) * | 2009-10-02 | 2011-04-07 | Jones Jonathan L | Rf coaxial surge protectors with non-linear protection devices |
US8400760B2 (en) | 2009-12-28 | 2013-03-19 | Transtector Systems, Inc. | Power distribution device |
US20110159727A1 (en) * | 2009-12-28 | 2011-06-30 | Matt Howard | Power distribution device |
US20110235229A1 (en) * | 2010-03-26 | 2011-09-29 | Nguyen Eric H | Ethernet surge protector |
US8432693B2 (en) | 2010-05-04 | 2013-04-30 | Transtector Systems, Inc. | High power band pass RF filter having a gas tube for surge suppression |
US8441795B2 (en) | 2010-05-04 | 2013-05-14 | Transtector Systems, Inc. | High power band pass RF filter having a gas tube for surge suppression |
US8730640B2 (en) | 2010-05-11 | 2014-05-20 | Transtector Systems, Inc. | DC pass RF protector having a surge suppression module |
US8611062B2 (en) | 2010-05-13 | 2013-12-17 | Transtector Systems, Inc. | Surge current sensor and surge protection system including the same |
US8976500B2 (en) | 2010-05-26 | 2015-03-10 | Transtector Systems, Inc. | DC block RF coaxial devices |
US8730637B2 (en) | 2010-12-17 | 2014-05-20 | Transtector Systems, Inc. | Surge protection devices that fail as an open circuit |
US9054514B2 (en) | 2012-02-10 | 2015-06-09 | Transtector Systems, Inc. | Reduced let through voltage transient protection or suppression circuit |
US9048662B2 (en) | 2012-03-19 | 2015-06-02 | Transtector Systems, Inc. | DC power surge protector |
US9190837B2 (en) | 2012-05-03 | 2015-11-17 | Transtector Systems, Inc. | Rigid flex electromagnetic pulse protection device |
US9124093B2 (en) | 2012-09-21 | 2015-09-01 | Transtector Systems, Inc. | Rail surge voltage protector with fail disconnect |
US9417266B2 (en) * | 2014-01-16 | 2016-08-16 | International Business Machines Corporation | Implementing handheld transfer impedance probe |
US20150198643A1 (en) * | 2014-01-16 | 2015-07-16 | International Business Machines Corporation | Implementing handheld transfer impedance probe |
US10129993B2 (en) | 2015-06-09 | 2018-11-13 | Transtector Systems, Inc. | Sealed enclosure for protecting electronics |
US10588236B2 (en) | 2015-07-24 | 2020-03-10 | Transtector Systems, Inc. | Modular protection cabinet with flexible backplane |
US9924609B2 (en) | 2015-07-24 | 2018-03-20 | Transtector Systems, Inc. | Modular protection cabinet with flexible backplane |
US10356928B2 (en) | 2015-07-24 | 2019-07-16 | Transtector Systems, Inc. | Modular protection cabinet with flexible backplane |
US10193335B2 (en) | 2015-10-27 | 2019-01-29 | Transtector Systems, Inc. | Radio frequency surge protector with matched piston-cylinder cavity shape |
US9991697B1 (en) | 2016-12-06 | 2018-06-05 | Transtector Systems, Inc. | Fail open or fail short surge protector |
US20180335553A1 (en) * | 2016-12-29 | 2018-11-22 | HKC Corporation Limited | Method for manufacturing color filter substrate and method for manufacturing liquid crystal panel |
US20190356080A1 (en) * | 2017-02-08 | 2019-11-21 | Toyota Jidosha Kabushiki Kaisha | Connector structure |
US10897102B2 (en) * | 2017-02-08 | 2021-01-19 | Toyota Jidosha Kabushiki Kaisha | Connector structure |
US10805817B2 (en) | 2017-11-22 | 2020-10-13 | Comcast Cable Communications, Llc | Near-field communication over service networks |
CN112230026A (en) * | 2020-11-09 | 2021-01-15 | 中国电子科技集团公司第二十九研究所 | Microwave probe for detecting local performance of microsystem |
CN112230026B (en) * | 2020-11-09 | 2023-05-02 | 中国电子科技集团公司第二十九研究所 | Microwave probe for detecting local performance of microsystem |
CN113917301A (en) * | 2021-10-09 | 2022-01-11 | 中国电子科技集团公司第二十九研究所 | Automatic test method of radio frequency product |
CN115598390A (en) * | 2022-11-29 | 2023-01-13 | 深圳市道格特科技有限公司(Cn) | Multi-branch coaxial broadband radio frequency probe |
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